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Contents
5-19. Test Setup for Time-Gated Spectrum Analyzer Capability . .
5-20. Setting the Center Frequency, Span, and Reference Level
5-21. Setting the Sweep Time .................
5-22. Setting the Gate Delay and Gate Length Using an Oscilloscope
5-23. Using Time-Gating to View Signal 1 ............
5-24. Placing the Gate Output During the Second Signal .....
5-25. Viewing Both Signals with Time-Gating ..........
5-26. Gate Not Occurring During the Pulse ...........
5-27. Gate is Occurring at the Beginning of the Pulse .......
5-28. Self-Calibration Data Results ...............
5-29. Rear Panel Connections for Time-Gated Spectrum Analyzer
Capability ......................
5-30.
Gate On ........................
5-31. Using the Level Gate Control ...............
5-32. N
dB
Bandwidth Measurement ..............
5-33. Percent Amplitude Modulation Measurement ........
5-34. Third-Order Intermodulation Measurement .........
5-35. Occupied Bandwidth ...................
5-36. Adjacent Channel Power .................
5-37. Adjacent Channel Power Extended ............
5-38. Adjacent Channel Power Graph ..............
5-39. Channel Power .....................
5-40. Channel Power Graph ..................
6-l.
Memory Card Catalog Information .............
6-2. Analyzer Memory Catalog Information ...........
6-3. CATALOG ON EVENT Display
..............
6-4. Connecting a Printer to the analyzer ...........
5-41
5-43
5-44
5-45
5-47
5-48
5-49
5-50
5-51
5-55
5-56
5-57
5-58
5-60
5-62
5-65
5-69
5-71
5-72
5-72
5-75
5-76
6-27
6-29
6-33
6-48
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